2023年12月16日发(作者：长安奔奔mini怎么样)
Group standardVW 80302Issue 2013-03Class. No.:Descriptors:8ME2high-voltage contacts, high-voltage, contacts, Test Specification, LV 215-2Motor Vehicle High-Voltage ContactsTest SpecificationPrefaceThis standard is based on LV 215-2, which was drawn up by representatives of automobile manu‐facturers Audi AG, BMW AG, Daimler AG, Porsche AG, and Volkswagen AG in workinggroup (WG) ions from the LV 215-2 are listed on the cover sheet of this standard. If modifications to indi‐vidual test sections become necessary in individual cases, these must be agreed upon separatelybetween the department in charge and the relevant reports will be accepted as long as the tests were performed by an independent testing insti‐tute that is accredited as per DIN EN ISO/IEC 17025. Acceptance of the test reports will not auto‐matically result in a 1: The LV numbers listed in this document correspond to the standards listed in table 1Working group (AK) document numberVolkswagen standard numberLV 214VW 75174LV 215-1LV 216-1LV 216-2VW 80304VW 75210-1VW 75210-2Previous issuesVW 80302: 2009-09, 2013-02ChangesThe following changes have been made to VW 80302: 2013-02:–Page 13 replacedAlways use the latest version of this electronically generated standard is authentic and valid without English translation is believed to be accurate. In case of discrepancies, the German version is alone authoritative and cal notation acc. to ISO/IEC Directives, Part 1 of 13Technical responsibilityI/EE-23EEKK/2EEE2Robert PietzschRandolf KallwitzTimo WetzelTel.: +49 841 89 41826Tel.: +49 5361 9 40418Tel.: +49 711 911 83538The Standards departmentEKDV/4 Dirk BeinkerTel.: +49 5361 9 32438EKDVManfred TerlindenVWNORM-2012-05oAll rights reserved. No part of this document may be provided to third parties or reproduced without the prior consent of one of the Volkswagen Group’s Standards departments.? Volkswagen AktiengesellschaftPage 2
LV 215-2: 2013-02
Contents
Page
Test number structure ..................................................................................................................... 3
Loads .......................................................................................................................................... 3
Properties tests ............................................................................................................................... 3
General rules .................................................................................................................................. 3
Determining the volume resistance (E 0.2, E 14.0, and E 16.0) ....................................................... 3
\"Crimp\" definition ............................................................................................................................. 3
PG 0 Inspection of as-received condition .................................................................................... 4
PG 1 Dimensions ........................................................................................................................ 5
PG 2 Material and surface analysis, contacts ............................................................................. 5
PG 3 Material and surface analysis, housing and single-wire seal .............................................. 5
PG 4 Contact overlap ................................................................................................................. 6
PG 5 Mechanical and thermal relaxation behavior ...................................................................... 6
PG 6 Interaction between contact and housing ........................................................................... 6
PG 7 Handling and functional reliability of the housing ............................................................... 6
PG 8 Insertion and retention forces of the contact parts in the housing ...................................... 7
PG 9 Pin insertion inclination/misuse safe (scoop-proofing) ....................................................... 7
PG 10 Contacts: Conductor pull-out strength ................................................................................ 7
PG 11 Contacts: Insertion and withdrawal forces; insertion frequency .......................................... 7
PG 12 Current heating, derating ................................................................................................... 8
PG 13 Housing influence on the derating ..................................................................................... 8
PG 14 Thermal time constant (current vs. temperature at n-times the nominal current) ................ 8
PG 15 Electrical stress test ...........................................................................................................
8
PG 16 Friction corrosion ............................................................................................................... 8
PG 17 Dynamic load ..................................................................................................................... 8
PG 18A Coastal climate load .......................................................................................................... 9
PG 18C De-icing salt load ............................................................................................................... 9
PG 19 Environmental simulation ................................................................................................... 9
PG 20 Climate load of the housing ............................................................................................... 9
PG 21 Long-term temperature aging ............................................................................................ 9
PG 22A Chemical resistance .......................................................................................................... 9
PG 22B Chemical resistance, extended test ................................................................................... 9
PG 23 Water leak tightness .......................................................................................................... 9
PG 24 Impenetrability 9
PG 28 Latching noise ................................................................................................................. 10
PG 29 Blind plug retention force ................................................................................................. 10
PG 50 EMC test ......................................................................................................................... 10
PG 51 Protection against contact ............................................................................................... 12
Page 3
LV 215-2: 2013-02
Test number structure
As per LV 214
Loads
As per LV 214
Properties tests
As per LV 214
As a supplement to LV 214:
E 0.2.3 Shielding volume resistance
E 0.3
E 0.4
Insulation resistance
Dielectric strength
DIN EN 50289-1-11
VG 95214-11
ISO 20653
E 50.1 Average wave impedance
E 50.2 Surface transfer impedance
E 51.1 Protection against contact
General rules
As per LV 214
As a supplement to LV 214:
Only cables released as per LV 216-1/LV 216-2 must be used for high-voltage contacts.
This LV is an extension to LV 214.
If modifications to individual test sections become necessary in individual cases, these must be
agreed upon separately between the appropriate department and the affected manufacturer.
In general: All tests in LV 214 are described as connector tests and must be conceptually applied
to threaded connections.
Determining the volume resistance (E 0.2, E 14.0, and E 16.0)
As per LV 214
Deviation: starting from class 4, measure the volume resistance as per DIN EN 60512-2-2 with a
test current of 10 A.
\"Crimp\" definition
As per LV 214 Page 4
LV 215-2: 2013-02
PG 0
Inspection of as-received condition
As per LV 214
As a supplement to LV 214:
E 0.2.3 Shielding volume resistance, measuring method as per E 0.2 (transition from component
to cable shield)
Document the exact position of the measuring points.
Requirement:
The measured values must correspond to the manufacturer’s specifications. The limits for
R1 and R2 must be adhered to (see LV 215-1) and the measured values (initial value,
standard deviation for the corresponding specimens) must be documented accordingly in
the test report. Limit R3 (see LV 215-1) must be adhered to and must be checked during
the release tests for the component, since the actual material combinations will only be
available at that point.
R1 = DC resistance between cable shield and connector shield
R2 = DC resistance between connector shield and interface shield
R3 = DC resistance between interface shield and unit
E 0.3 Insulation resistance
In addition, measure the insulation resistance between the contacts and the housing
shielding.
Requirement:
Rinsul >200 megaohms with V = 1 000 VDC, t = 60 s
E 0.4 Dielectric strength (one-time test)
The test voltage must be selected from Table 1.
SAE J1742
ISO 6469-3 with a test duration of 60 seconds and a leakage current <10 mA. Page 5
LV 215-2: 2013-02
Table 1: Test voltages
RMS voltage
connector
50 – 100 V
110 – 300 V
300 – 1 000 V
AC voltage to be
applied
(RMS)
1 000 V
1 600 V
DC voltage to be
applied
1 600 V
2 500 V
1 000 V plus 2 times the 1 600 V plus 3,2 times
connector\'s nominal the connector\'s nominal
voltage voltage
Figure 1: Test setup
Housing insulation:
Connect all circuits to each other (see Figure 1) and wrap the outside of the specimen in
conductive film.
Apply the test voltage between the film and the circuits for one minute. Document the
results.
Conductor insulation:
Test each conductor individually by using the shield as the other reference point.
Apply the test voltage between the conductors and the shield for one minute. Document
the results.
Requirement:
During the test, no dielectric breakdown or flash-overs must occur between the individual
chambers or between the chambers and the specimen\'s exterior.
PG 1
PG 2
PG 3
Dimensions
As per LV 214
Material and surface analysis, contacts
As per LV 214
Material and surface analysis, housing and single-wire seal
As per LV 214
As a supplement to LV 214: Page 6
LV 215-2: 2013-02
E 3.1
Material test of housing and single-wire seal
…
? Documentation of the materials:
o Creepage current classification (CTI values)
PG 4
PG 5
…
Contact overlap
As per LV 214
Mechanical and thermal relaxation behavior
As per LV 214 for HV contacts
Test the shield contact with a suitable method for measuring the contact normal force.
The following applies to HV threaded connections:
The screw assembly for the housing and tubular cable lug must be designed as
appropriate for the component and checked during the release tests for the component,
since the actual material combinations will only be available at that point.
PG 6
B 6.1
Interaction between contact and housing
As per LV 214
Drop test (with new housings; see batch size) as per DIN EN 60068-2-31, free fall as per
method 1
Test setup:
Housing fully populated with max. cable cross-sectional area; cable length: 500 mm; drop
height: 1 m
Requirement:
There must not be any discernible broken parts or any damage that will have a negative
impact on suitability of use
PG 7
Handling and functional reliability of the housing
As per LV 214
Deviating from LV 214:
As a supplement to LV 214: Page 7
LV 215-2: 2013-02
Table 3 as per LV 214: Positive-locking housing retention forces
Positive-locking housing retention forces (N)
Contact size
0,63 to 1,2 mm
>1,2 to 2,8 mm
>2,8 to 6,3 mm
>6,3 mm
≥8 mm
PG 8
>60
>80
>100
>150
>250
Number of pins
1-pin to 2-pin 3-pin to 6-pin >6-pin
>80
>100
>100
>150
>500
>100
>100
>100
>150
Insertion and retention forces of the contact parts in the housing
As per LV 214, provided the design allows for the contact parts to be removed.
The values for ≥8 mm apply to class 4 with a locking barb. Preferably, test them directly on
the contact with a push-out test.
PG 9
Pin insertion inclination/misuse safe (scoop-proofing)
As per LV 214
PG 10 Contacts: Conductor pull-out strength
As per LV 214
Requirement:
The conductor pull-out strengths as per LV 215-1 must be adhered to.
As a supplement to LV 214:
PG 11 Contacts: Insertion and withdrawal forces; insertion frequency
The following applies to HV threaded connections:
B 11.1 Insert and disconnect the specimens according to their surface finish. The following
tightening torques (±10%) apply to threaded electrical connections:
M6 9 Nm
M8 15 Nm
M10 25 Nm
Requirement:
It is impermissible for the contact surface required for proper operation to be worn all the
way through to the base material or barrier layer. Corresponding documentation must be
provided.
As per LV 214 Page 8
LV 215-2: 2013-02
E 11.2 Retention force of protection-against-contact element
Use a suitable device to try to pull the protection-against-contact element.
Requirement:
Verify that the protection-against-contact element can handle twice the pull-out force of the
socket contact against the insertion direction and, if there are installed elements, against
the installation direction of the protection-against-contact cap. The force that the
protection-against-contact element can handle must be at least 50 N if the aforementioned
withdrawing force times two is lesser.
PG 12 Current heating, derating
As per LV 214
As per E 0.1, measure and document the contact resistances as per E 0.2 as well.
PG 13 Housing influence on the derating
As per LV 214
Plot derating curves with a 10-A shield current as well.
As a supplement to LV 214:
PG 14 Thermal time constant (current vs. temperature at n-times the nominal current)
As per LV 214
Plot the cool-down curve in addition to the heat-up time constant.
PG 15 Electrical stress test
As per LV 214
As a supplement to LV 214 as per E 0.2:
E 0.2.3 Shield contact resistance
The following applies to HV threaded connections:
B 15.1 Insert and disconnect the specimens 2 times.
PG 16 Friction corrosion
As per LV 214, following consultation
PG 17 Dynamic load
As per LV 214
Vibration profile as per severity 3
Temperature profile as per severity 4
As a supplement to LV 214 as per E 0.2:
E 0.2.3 Shield contact resistance Page 9
LV 215-2: 2013-02
PG 18A Coastal climate load
As per LV 214
As a supplement to LV 214 as per E 0.2:
E 0.2.3 Shield contact resistance
PG 18C De-icing salt load
As per LV 214
Metal housings must meet additional OEM-specific requirements (OEM – original
equipment manufacturer).
PG 19 Environmental simulation
As per LV 214
As a supplement to LV 214 as per E 0.2:
E 0.2.3 Shield contact resistance
PG 20 Climate load of the housing
As per LV 214
PG 21 Long-term temperature aging
As per LV 214
As a supplement to LV 214 as per E 0.2:
E 0.2.3 Shield contact resistance
PG 22A Chemical resistance
Omitted
PG 22B Chemical resistance, extended test
As per LV 214
PG 23 Water leak tightness
Deviation:
Open cable ends
Test: B 23.3 Thermal shock
PG 24 Impenetrability to paint
Following consultation Page 10
LV 215-2: 2013-02
PG 28 Latching noise
As per LV 214
PG 29 Blind plug retention force
As per LV 214, provided they are included in the design
PG 50 EMC test
Purpose: Measurement of the effectiveness of the housing shielding or the surface transfer
impedance.
Batch size:
Contact parts:
Housing:
Type of test:
DIN EN 50289-1-11
Determine the average wave impedance of the bulk cable with the capacitance and
service life as per DIN EN 50289-1-11
E 50.2 Surface transfer impedance VG 95214-11
Conduct the test, based on VG 95214-11, within a frequency range of 100 kHz to
500 MHz. Measure the difference between a reference cable (bulk) and a finished cable.
The specimen\'s total length is (1 000 ±100) mm from the terminal resistor
R3 to the
receiver connection (see Figure 2).
Measuring setup and coupling cable:
VG 95214-11 describes the test setup.
The DC resistance between the measuring contact systems, on both sides of the
specimen, that connect the equipment under test (EUT) and the measuring adapters must
not be more than 10% greater than the measured shield resistance of the EUT without the
measuring contact systems.
As the terminal resistance for the specimen, use the asymptotic wave impedance value
that results at high frequencies as per E 50.1. Terminal resistances
R0 and
R3 must be
suitable for high frequencies throughout the entire frequency range.
Note:
Carbon film and wire-wound resistors must not be used. A reflection measurement on the
network analyzer (NWA) can be carried out on the resistors in order to check their
frequency stability. Insert the resistors into an N connector for this purpose. The reflection
factor can be improved by connecting several SMD resistors in parallel.
The entire measuring setup must be insulated (do not use a ground plane). The NWA
provides the reference ground. Ensure that there are no metallic objects in the vicinity of
the setup (minimum clearance: 20 cm).
E 50.1 Average wave impedance
3 housings
All variants, conductor cross-sectional areas, and surfaces
All variants; any keying and color Page 11
LV 215-2: 2013-02
The coupling characteristics must not change during the measurement. For this purpose,
the supply cable in particular must be secured in such a way that there is continuous
contact between the supply cable and the specimen.
The supply cable\'s reflection factor must be up to 30 MHz <20 dB and up to
110 MHz <10 dB.
Perform the measurement at the receiver and sender with a system impedance of 50 Ω.
Any impedance mismatch must not be corrected. In particular, this means that impedance
matching circuits, as well as the NWA\'s port Z conversion function, must not be used.
(This is to prevent the measured result from depending on the quality of the impedance
matching circuit setup or from conversion algorithms by different NWA manufacturers.)
Measurement:
Carry out the measurement with the \"far-end\" configuration.
Measure the difference between a reference cable and a cable terminated on one end.
The cable terminated on one end consists of the reference cable and the high-voltage
contact system being evaluated. Use a released high-voltage cable as per LV 216-2 as
the reference cable. The chosen cable\'s cross-sectional area must match the connector\'s
permissible cross-sectional area.
In the case of multicore cables, connect the insulated wires in parallel if a common shield
is used. In the case of contact systems with multiple shielded individual cables that use a
common contact carrier, consult with the EMC department to determine whether the
individual cables need to be measured separately or whether a combined measurement
with all the shields needs to be performed.
Perform the measurement at three or four positions within the specimen\'s perimeter. For
this purpose, turn the specimen 120° or 90° relative to the supply cable. Ensure that the
supply cable is carefully secured and impedance-matched for every measurement.
Use \"OSL\" (open-short load) and \"Thru\" as the calibration methods.
Perform the measurements from 100 kHz to 500 MHz.
Figure 2: Parallel wire method setup Page 12
LV 215-2: 2013-02
Evaluation:
The surface transfer impedance (ZT) must be calculated for the evaluation. Use the
formula in VG 95214-11 to convert the measured coupling attenuation
AT to surface
transfer impedance
ZT:
AT20ZT=2?R0?R3?10l
ZT
Surface transfer impedance in mΩ/m
l Specimen coupling length (as per figure 2: 500 mm)
R0
Supply wire terminal resistance (50 Ω)
R3
Specimen terminal resistance (the DUT\'s average wave impedance)
AT
Measured level on network analyzer/voltage ratio, in dB, between measuring
receiver and measuring sender.
Document the values used as per the formula.
For each specimen, show all the measurements for the angles in a single diagram in the
test report.
For all measurements, show the information related to determining the supply cable
reflection factor as necessary for the measurement in the test report.
Requirement:
The limits must be adhered to (see LV 215-1)
The target data must be defined in coordination with the pertinent manufacturer or must
comply with the pertinent OEM Performance Specification.
PG 51 Protection against contact
Goal:
Verifying that protection against contact works properly
Batch size:
Contact parts:
Housing:
Type of test:
1 housing
All variants, largest conductor cross section, and any surface
All variants; any keying and color
E 51.1 Protection against contact ISO 20653
Press the access probe against every opening on the housing using the force specified in
Table 2. If it penetrates partially or completely, it is moved into every possible position.
However, the locating surface must not go completely through the opening under any
circumstances.
Possible mechanical parts must be moved slowly during the test. Page 13
LV 215-2: 2013-02
Signal circuit method:
When performing tests on low-voltage operating equipment, a low-voltage power source
(not lower than 40 V and not higher than 50 V) must be connected in series with a suitable
lamp between the probe and the hazardous parts inside the housing.
Table 2: Test finger access probe
Requirement:
A fully assembled HV connector system must have an IPXXD degree of protection.
A non-fully assembled HV connector system must have an IPXXB degree of protection.
The access probe must not come into contact with hazardous (live) parts.
The lamp must not turn on in the signal circuit method.
No measurable voltage or arcing must occur during the high-voltage test.
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